Close-up of Cryogenic Test Station (IMAGE) Georgia Institute of Technology Caption Close up of cryogenic test station in the Georgia Electronic Design Center at Georgia Tech in Atlanta. Black objects in the center are the silicon-germanium chips under study. Credit Georgia Tech Photo: Gary Meek Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.