Silicon Nanowires (1 of 2) (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption Figure (a) is a cross-sectional scanning electron microscope image of an array of rough silicon nanowires with an inset showing a typical wafer chip of these wires. Figure (b) is a transmission electron microscope image of a segment of one of these wires in which the surface roughness can be clearly seen. The inset shows that the wire is single crystalline all along its length. Credit Courtesy of Arun Majamdar and Peidong Yang, Lawrence Berkeley National Laboratory Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.