X-Ray Speckle Pattern (IMAGE) University of Vermont Caption A beam of X-rays scattering off a thin film of silicon form this speckle pattern that corresponds to the details of the surface. University of Vermont scientists used these kinds of images as part of a discovery that is providing a new view at the nanoscale. Credit Courtesy Randall Headrick, UVM Usage Restrictions with coverage of associated story License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.