Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (2 of 2)

Contact: Evelyn Brown
evelyn.brown@nist.gov
301-975-5661
National Institute of Standards and Technology (NIST)

Nanoscale Dimensioning Is Fast, Cheap with New NIST Optical Technique (2 of 2)

Caption: Using an optical microscope, several images of a 60 nanometer gold particle sample are taken at different focal positions and stacked together. This computer-created image shows the resultant TSOM image.

Credit: NIST

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