Contact: Mark Bello
mark.bello@nist.gov
301-975-3776
National Institute of Standards and Technology (NIST)
Caption: NIST researcher Jabez McClelland makes adjustments on the new magneto-optical trap ion source, capable of focusing beams of ions down to nanometer spots for use as a 'nano-scalpel' in advanced electronics processing.
Credit: Holmes, NIST
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