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Contact: John Toon
jtoon@gatech.edu
404-894-6986
Georgia Institute of Technology Research News
Caption: Georgia Tech researchers illustrate how their new statistical technique improves measurement of nanostructure properties by correcting data errors. Shown (left to right) are Zhong Lin Wang, V. Roshan Joseph, C.F. Jeff Wu and Xinwei Deng.
Credit: Georgia Tech Photo: Gary Meek
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Related news release: New Statistical Technique Improves Precision of Nanotechnology Data
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