Contact: Mark Bello
mark.bello@nist.gov
301-975-4034
National Institute of Standards and Technology (NIST)

3-D Microbeam Experiment

Caption: Novel 3-D microbeam experiment enables direct proof of the Mughrabi model of metal stress. Submicron X-ray beam (broad arrow) penetrates a deformed copper single crystal and is diffracted onto a CCD detector. Platinum wire profiler (circle) traverses the sample and successively intercepts diffracted X-rays, providing depth measurement and allowing strains to be measured from individual dislocation cells.

Credit: NIST

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