Contact: Kathy Svitil
ksvitil@caltech.edu
626-395-8022
California Institute of Technology

Convergent-beam Microscopy

Caption: This is the diffraction obtained for silicon with 4D electron microscopy. The nanoscale can be determined from the patterns the structure.

Credit: Zewail/Science/AAAS

Usage Restrictions: None

Related news release: Caltech scientists film photons with electrons