Contact: Chad Boutin
National Institute of Standards and Technology (NIST)
Caption: This atomic-force microscopy image shows wrinkling in a single-wall carbon nanotube membrane; the inset shows an optical reflection micrograph of the membrane without any strain. The random arrangement of the nanotubes shown in the inset creates conductivity, but wrinkling can disrupt that. Each image is 40 micrometers in width.
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