Contact: Laura Ost
National Institute of Standards and Technology (NIST)
Caption: A false color SPIM image (b) reveals the same physical structure of a gold pattern on glass as an atomic force microscope image (a), but the high intensity regions in the SPIM image indicate that electron ejection is much more efficient at metal edge discontinuities.
Credit: Credit: O.L.A. Monti, T.A. Baker, and D.J. Nesbitt/JILA
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