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Contact: Liz Ahlberg
eahlberg@illinois.edu
217-244-1073
University of Illinois at Urbana-Champaign

AMF Measures Self-cooling in Graphene

Caption: An atomic force microscope tip scans the surface of a graphene-metal contact to measure temperature with spatial resolution of about 10 nm and temperature resolution of about 250 mK. Color represents temperature data.

Credit: Alex Jerez, Beckman Institute for Advanced Science and Technology

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Related news release: Self-cooling observed in graphene electronics


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