Contact: Oihane Lakar
Caption: This image shows infrared nanospectroscopy with a thermal source. The tip is illuminated with the broadband infrared radiation from of a thermal source and the backscattered light is analyzed with a Fourier spectrometer, yielding local infrared spectra with a spatial resolution better than 100 nm. The displayed graph shows infrared spectra of differently processed oxides in an industrial semiconductor device.
Credit: Copyright F. Huth, CIC nanoGUNE.
Usage Restrictions: Image is copyrighted
Related news release: CIC nanoGUNE develops Nano-FTIR-nanoscale infrared spectroscopy with a thermal source