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Contact: Susan Ray
sray@magnet.fsu.edu
850-644-9651
National High Magnetic Field Laboratory
Caption: This image is a scanning electron microscope micrograph of a strongly crumpled graphene sheet on a silicon wafer. The lateral size of the image is 20 microns. The Si wafter is at the bottom right corner of the image.
Credit: Courtesy of the Foundation of Fundamental Research on Matter, the Netherlands
Usage Restrictions: please credit the FOM
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