NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics (image) National Institute of Standards and Technology (NIST) Share Print E-Mail Caption Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics. Credit M. Strus/NIST Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.