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Contact: Laura Ost
laura.ost@nist.gov
303-497-4880
National Institute of Standards and Technology (NIST)

New JILA Apparatus Measures Fast Nanoscale Motions

Caption: This slow-motion simulation of the JILA nanoscale motion detector shows the wiggling of a floppy metal beam, just 100 nanometers thick, as it is struck by an electric current at the dot. Red indicates the greatest change in position from the rest state.

Credit: Credit: K. Lehnert/JILA

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Related news release: New JILA apparatus measures fast nanoscale motions


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