New JILA Apparatus Measures Fast Nanoscale Motions (image) National Institute of Standards and Technology (NIST) Share Print E-Mail Caption This slow-motion simulation of the JILA nanoscale motion detector shows the wiggling of a floppy metal beam, just 100 nanometers thick, as it is struck by an electric current at the dot. Red indicates the greatest change in position from the rest state. Credit Credit: K. Lehnert/JILA Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.