Contact: Lynn Yarris
DOE/Lawrence Berkeley National Laboratory
Caption: By collecting and comparing HARPES data at room and cryo temperatures, Berkeley Lab researchers were able to correct for density of state (DOS) and x-ray photoelectron diffraction (XPD) influences in determining electronic structures deep below sample surfaces.
Credit: Image from Fadley group
Usage Restrictions: None
Related news release: Berkeley Lab scientists unveil an X-ray technique called HARPES