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Contact: Lynn Yarris
DOE/Lawrence Berkeley National Laboratory


Caption: By collecting and comparing HARPES data at room and cryo temperatures, Berkeley Lab researchers were able to correct for density of state (DOS) and x-ray photoelectron diffraction (XPD) influences in determining electronic structures deep below sample surfaces.

Credit: Image from Fadley group

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Related news release: Berkeley Lab scientists unveil an X-ray technique called HARPES

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