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Contact: Liz Ahlberg
eahlberg@illinois.edu
217-244-1073
University of Illinois at Urbana-Champaign

Ion-Sharpened STM Probe

Caption: This is a traditionally etched tungsten STM probe (left), sharpened to a 1-nanometer point after bombarding it with ions (right).

Credit: Joseph Lyding

Usage Restrictions: None

Related news release: Microscope probe-sharpening technique improves resolution, durability


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