Contact: Liz Ahlberg
University of Illinois at Urbana-Champaign
Caption: Professor Joe Lyding has recently developed a new method for sharpening probes for Scan Probe Microscopes. Using ions to sharpen the tip to an atomic level, the ultrasharp probes allow for an extremely high, atomic resolution in the microscope's images. Hi-res at http://www.youtube.com/watch?v=Wkf2DxbKSFA.
Credit: Anne Lukeman
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Related news release: Microscope probe-sharpening technique improves resolution, durability