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Contact: Liz Ahlberg
eahlberg@illinois.edu
217-244-1073
University of Illinois at Urbana-Champaign

Ultrasharp Microscope Probes

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Caption: Professor Joe Lyding has recently developed a new method for sharpening probes for Scan Probe Microscopes. Using ions to sharpen the tip to an atomic level, the ultrasharp probes allow for an extremely high, atomic resolution in the microscope's images. Hi-res at http://www.youtube.com/watch?v=Wkf2DxbKSFA.

Credit: Anne Lukeman

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Related news release: Microscope probe-sharpening technique improves resolution, durability


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