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Contact: Monika Landgraf
presse@kit.edu
49-721-608-47414
Helmholtz Association of German Research Centres

Deep below the Silicon Surface, the Sprie Method Produces Regular Structures in the Micrometer Range

Caption: Deep below the silicon surface, the SPRIE method produces regular structures in the micrometer range that refract light.

Credit: Photo: KIT/CFN

Usage Restrictions: None

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