Contact: ZHAO ChunWang
Science in China Press
Caption: This shows the: (a) TEM bright-field image of a micro-crack in single-crystal silicon; (b) HRTEM image of a crack-tip (boxed area in figure a); (c) shear strain field of a crack-tip; and (d) strain-distance curves on the crack plane.
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Related news release: Near atomic-scale deformation fields of a crack-tip were mapped experimentally at IMUT