Contact: Caroline Perry
Caption: Left: This diagram shows the experimental setup used for measuring the reflectivity of the vanadium-sapphire device. The vanadium oxide layer is only 180 nanometers thick, much thinner than the wavelength of the incident infrared light. Right: At just the right temperature (light blue line), the reflectivity of the device drops almost to zero (99.75 percent absorbance) for infrared light at a wavelength of 11.6 microns.
Credit: Illustrations courtesy of Mikhail Kats.
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