Contact: Lynn Yarris
lcyarris@lbl.gov
510-486-5375
DOE/Lawrence Berkeley National Laboratory
Caption: Stress-induced deformation along the edges of nanocrystalline nickel reflect the dislocation activity observed by researchers at Berkeley Lab’s Advanced Light Source using a radial diamond-anvil-cell X-ray diffraction experimental station.
Credit: Image courtesy of Bin Chen, Berkeley Lab
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Related news release: Nanocrystals not small enough to avoid defects