Contact: Andreas Battenberg
battenberg@zv.tum.de
49-892-891-0510
Technische Universitaet Muenchen

Ptychographic Improvement of X-Ray Microscopic Images

Caption: While the test object is moved through the X-ray beam with nanometer precision, the scattered X-rays are captured by a detector. The scattering images are then reconstructed to an image of the sample.

Credit: Technische Universitaet Muenchen / Paul Scherrer Institute, Villigen (Switzerland)

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