Contact: Andreas Battenberg
battenberg@zv.tum.de
49-892-891-0510
Technische Universitaet Muenchen
Caption: Compared to a recording with conventional technology (left), ptychographic processing highly improves quality of the X-ray microscopic image (right).
Credit: Technische Universitaet Muenchen / Paul Scherrer Institute, Villigen (Switzerland)
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Related news release: Improved X-ray microscopic imaging