Contact: Michael E. Newman
michael.newman@nist.gov
301-975-3025
National Institute of Standards and Technology (NIST)

Measurements from the Edge: Magnetic Properties of Thin Films

Caption: Spectroscopic image showing the microwave-frequency magnetic resonances of an array of parallel, metallic thin film nanowires ('stripes'). The peak in the center is due to resonances occurring at the stripe edges while the strong horizontal bar is due to resonances in the body of the stripes.

Credit: Brian Maranville

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Related news release: Measurements from the edge: magnetic properties of thin films