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Contact: William P. King
wpk@illinois.edu
217-244-3864
University of Illinois College of Engineering

AFM Image

Caption: This is an atomic force microscope image of plasmonic semiconductor microparticles.

Credit: William P. King, University of Illinois at Urbana-Champaign

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Related news release: U. of Illinois researchers measure near-field behavior of semiconductor plasmonic microparticles


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