Contact: Michael Baum
michael.baum@nist.gov
301-975-2763
National Institute of Standards and Technology (NIST)

Fatigue Effects in Silicon

Caption: Optical micrographs of contact damage in silicon from cyclic stress show progressive damage after (a) 1,000 cycles, (b) 5,000 cycles, (c) 20,000 cycles and (d) 85,000 cycles. Color added for clarity, white circle shows computed size of the contact circle.

Credit: NIST

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Related news release: Job-related stress: NIST demonstrates fatigue effects in silicon