Contact: Lynn Yarris
lcyarris@lbl.gov
510-486-5375
DOE/Lawrence Berkeley National Laboratory

Silicon Nanowires (1 of 2)

Caption: Figure (a) is a cross-sectional scanning electron microscope image of an array of rough silicon nanowires with an inset showing a typical wafer chip of these wires. Figure (b) is a transmission electron microscope image of a segment of one of these wires in which the surface roughness can be clearly seen. The inset shows that the wire is single crystalline all along its length.

Credit: Courtesy of Arun Majamdar and Peidong Yang, Lawrence Berkeley National Laboratory

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