Contact: Kevin Mayhood
Case Western Reserve University
Caption: This image shows the Case Western Reserve measurement apparatus for studying the SiC NEMS logic building blocks. Insets: (a) An illustration of the basic device structure. (b) A circuit diagram for device testing. (c) Representative measured data of abrupt and non-leakage switching characteristics. (d) Recorded long cycles of robust switching in ambient air.
Credit: Image credit: Philip Feng / Case Western Reserve Univeristy
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