Contact: Michael Baum
michael.baum@nist.gov
301-975-2763
National Institute of Standards and Technology (NIST)
Caption: Heart of the orthogonal tracking microscope system developed at NIST is this nanoparticle solution sample well etched in silicon. Careful orientation of the silicon crystal makes it possible to chemically etch angled sides in the well so smooth they act as mirrors. In this configuration, four side views of a nanoparticle floating in solution (left) are reflected up. A microscope above the well sees the real particle (center, right) and four reflections that show the particle's vertical position.
Credit: NIST
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Related news release: All done with mirrors: NIST microscope tracks nanoparticles in 3-D