Contact: Mark Esser
National Institute of Standards and Technology (NIST)
Caption: Micrographs of a spot of electronics solder demonstrate how the lithium FIB microscope (left) clearly distinguishes between the lead and tin components. An SEM image (right) captures mainly topological differences. Images show a region approximately 28 micrometers across.
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Related news release: This FIB doesn't lie: New NIST microscope sees what others can't