Micrographs of a Spot of Electronics Solder (image) National Institute of Standards and Technology (NIST) Share Print E-Mail Caption Micrographs of a spot of electronics solder demonstrate how the lithium FIB microscope (left) clearly distinguishes between the lead and tin components. An SEM image (right) captures mainly topological differences. Images show a region approximately 28 micrometers across. Credit Twedt/CNST Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.