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Contact: Abby Vogel
avogel@gatech.edu
404-385-3364
Georgia Institute of Technology Research News
Caption: Five micron by five micron tapping mode atomic force microscopy images taken in four seconds with the FIRAT probe (top) and the regular AFM tip (bottom). After four seconds, the 256-line FIRAT image is complete while the regular image contains just four lines of data.
Credit: Georgia Tech Image: Levent Degertekin
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Related news release: Fast AFM probes measure multiple properties of biomolecules or materials simultaneously
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