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Contact: Abby Vogel
avogel@gatech.edu
404-385-3364
Georgia Institute of Technology Research News
Caption: Levent Degertekin (left), a professor in the George W. Woodruff School of Mechanical Engineering at Georgia Tech, shows the adapted AFM holder while graduate student Guclu Onaran points to an image of the FIRAT probe scanning a sample. The front monitor displays the topography of a sample obtained by the FIRAT probe at a speed of 2 frames per second, which is nearly 100 times faster than the normal speed.
Credit: Georgia Tech Photo: Gary Meek
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Related news release: Fast AFM probes measure multiple properties of biomolecules or materials simultaneously
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