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Contact: Abby Vogel
avogel@gatech.edu
404-385-3364
Georgia Institute of Technology Research News
Caption: An AFM holder adapted so that the FIRAT probe can be used on existing AFM systems. The FIRAT probe can simultaneously measure topography and material properties including adhesion, stiffness, elasticity and viscosity.
Credit: Georgia Tech Photo: Gary Meek
Usage Restrictions: None
Related news release: Fast AFM probes measure multiple properties of biomolecules or materials simultaneously
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