![[ Back to EurekAlert! ]](http://www.eurekalert.org/images/back2e.gif){kind=small}
|
Contact: Abby Vogel
avogel@gatech.edu
404-385-3364
Georgia Institute of Technology Research News
Caption: Georgia Tech's Gregory Durgin designed a system capable of simultaneously detecting hundreds of RFID tags and rapidly testing new RFID tag antenna prototypes, like the one he’s holding.
Credit: Georgia Tech Photo: Gary Meek
Usage Restrictions: None
Related news release: RFID testbed measures multiple tags at once and rapidly assesses new antenna designs
|