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Contact: Abby Vogel
avogel@gatech.edu
404-385-3364
Georgia Institute of Technology Research News
Caption: Components of the testbed Georgia Tech's Gregory Durgin developed to simultaneously measure hundreds of radio frequency identification RFID tags and rapidly test new RFID tag prototypes.
Credit: Georgia Tech Photo: Gary Meek
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Related news release: RFID testbed measures multiple tags at once and rapidly assesses new antenna designs
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