Contact: Paul Preuss
paul_preuss@lbl.gov
510-486-6249
DOE/Lawrence Berkeley National Laboratory

X-ray Diffraction

Caption: The diffraction imaging layout at beamline 9.0.1: from left, coherent x-rays illuminate the sample (center), which is mounted on a silicon nitride window just 50 nanometers thick in a movable frame. Diffraction patterns at various orientations are measured using a downstream CCD camera, right. A beamstop prevents the direct beam from striking the CCD; multiple exposure times are summed to expand the CCD's dynamic range.

Credit: Lawrence Berkeley National Laboratory

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