Advanced Computing Brings Autonomous Investigations to Nanostructured Surfaces (IMAGE)

DOE/US Department of Energy

Advanced Computing Brings Autonomous Investigations to Nanostructured Surfaces

Caption

Illustration depicts an autonomous experiment that directs an ultrasharp Scanning Probe Microscopy (SPM) tip across a 2D material surface, capturing the local atomic and electronic structures.

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Image courtesy of Lawrence Berkeley National Laboratory

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Image courtesy of Lawrence Berkeley National Laboratory

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