Figure 1 (IMAGE)

National University of Singapore

Figure 1

Caption

From left to right: An energy-filtered transmission electron microscopy image of a specimen with features on either side, including a nano-pit etched through an amorphous silicon nitride (SiNx) membrane; the top view of the 3D reconstruction that shows etching artifacts such as the rim, petals and a debris blob; the bottom view shows the widening of the nano-pit opening towards the bottom surface.

Credit

Communications Physics

Usage Restrictions

NA

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.