Figure 3 (IMAGE)

University of Pittsburgh

Figure 3

Caption

SEM images of MPs prepared using the salting out method. Representative (a) high magnification and (b) low magnification imagesshow Silk MPs without IONPs. Representative (c) high and (d) low magnification images depict SIMPs with IONPs conjugated with GSH.Representative (e) high and (f) low magnification images show SIMPs-N with IONPs that are not conjugated with GSH. (g) SEM image withoverlaid rectangles indicating the areas where the EDS spectra were gathered. The bar chart presents the average weight percent of Fe measured inthese spectra for SIMPs and Si chip regions. The average weight percentage of Fe on the Si chip was consistently measured as zero, and thus, noerror bars are shown for the blue column. Scale bars: Panels a, c, e, and g (1 μm) and panels b, d, and f (10 μm).

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Ande X. Marini

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