Novel image-based anomaly detection model can improve anomaly detection in low-light industrial environments (IMAGE)

Shibaura Institute of Technology

Novel image-based anomaly detection model can improve anomaly detection in low-light industrial environments

Caption

Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in low-light industrial settings.

Credit

Dr. Phan Xuan Tan from Shibaura Institute of Technology | Source link: https://www.sciencedirect.com/science/article/pii/S2590123025003901?via%3Dihub

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