High-resolution thermal diffusivity area maps of Bi2Te3. (IMAGE)

Technical University of Denmark

High-resolution thermal diffusivity area maps of Bi2Te3.

Caption

High-resolution thermal diffusivity area maps of Bi2Te3. Illustration of the results using the M4PP setup to map the thermal diffusivity of the Bi2Te3 grains of different orientations. (A) The measured thermal diffusivity using the M4PP in X-scan direction and (B) the measured thermal diffusivity using the M4PP in Y-scan direction. The thermal diffusivity values obtained in the two different scan directions are encoded in the color code to the right. The upper limit of the color bar corresponds to the cutoff at 1.8 mm2/s. (C) EBSD images of the grains, in IPF map notation and an eye guide arrow indicating the normal [001] of the crystal structure. (D) is an optical image of the Bi2Te3 grains. © 2025 The Authors. DOI: 10.1126/sciadv.ads653 

Credit

© 2025 The Authors. DOI: 10.1126/sciadv.ads653

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