Experimental schematic (IMAGE)

University of Wisconsin-Madison

Experimental schematic

Caption

Tightly focused XFEL pulses are directed at a sample made of copper or manganese. Any X-ray photons that the sample emits in the same forward direction as the input pulse hit a piece of instrumentation that disperses them by wavelength and reflects it based on its angle. This dispersed X-ray light is next read by a detector, which measures its properties. 

Credit

Linker et al., 2025

Usage Restrictions

N/A

License

Original content

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