Figure 1 (IMAGE)

Advanced Institute for Materials Research (AIMR), Tohoku University

Figure 1

Caption

LSV curves (a), Tafel slope (b) and EIS Nyquist plots (c) of RhRu3Ox, Hom-RuO2 and Com-RuO2. The solution resistance was determined from the intersection of the EIS curve with the real axis when the imaginary part (Z″) equals zero, yielding a value of 25.0 ± 0.4Ω. (d) C2dl plots calculated from CV curves. (e) Tafel plots of RhRu3Ox at different temperatures. (f) Arrhenius plot of OER exchange current density of RhRu3Ox and Hom-RuO2 CoP. 

Credit

©Heng Liu et al.

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