KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​ (IMAGE)

The Korea Advanced Institute of Science and Technology (KAIST)

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity​

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<(From Left) Professor Byungha Shin, Ph.D candidate Chaeyoun Kim, Dr. Oki Gunawan>

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KAIST

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