Clay with a Coating: Visualizing Nutrient-Loaded Montmorillonite in Wheat Xylem. (IMAGE)
Caption
Transmission electron microscopy (TEM) images of the montmorillonite in xylem sap detected with high-angle annular dark field mode (HAADF) and elemental mapping (including C, O, Al, Si, Fe, K, Mg, and P) using energy dispersive spectrometry (a and b), line-scanning profiles of the C element (c), montmorillonite particles identified in xylem sap using scanning electron microscopy (d), and nanoscale atomic force microscopy with infrared spectroscopy spectra of the representative area of the montmorillonite particle surface (e). Wt = weight percent; At = atomic percent; IR = infrared spectroscopy.
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