Lock-in thermography maps hidden defects in freestanding oxide membranes (IMAGE)
Caption
(a) Schematic illustration of lock-in thermography (LIT) measurements for detecting microscopic structural imperfections in freestanding oxide membranes. (b) Optical microscopy image of a freestanding SrRuO3 membrane. In the low-magnification optical image, the dense wrinkle background obscures most microcrack signals. (c,d) Corresponding LIT amplitude and phase images of the freestanding SrRuO3 membrane. Compared with the optical image, the LIT images clearly reveal multiple crack-induced thermal anomalies over a wide field of view.
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