Cross-Sectional Scanning Electron Microscopy Images (IMAGE)

American Institute of Physics

Cross-Sectional Scanning Electron Microscopy Images

Caption

This is a cross-sectional scanning electron microscopy images of a 750 nm period grating fabricated by focused ion beam milling in a 300 nm thick amorphous germanium antimony telluride film on silica.

Credit

Karvounis/Gholipour/MacDonald/Zheludev, Optoelectronics Research Centre, University of Southampton

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