SWAPPS Depth Profile (IMAGE)

DOE/Lawrence Berkeley National Laboratory

SWAPPS Depth Profile

Caption

SWAPPS measures the depth profiles of chemical elements with sub-nanometer resolution in the direction perpendicular to the interface, utilizing an X-ray standing wave field that can be tailored to focus on specific depths, i.e., near the surface or near the iron oxide interface.

Credit

(Image courtesy of Chuck Fadley)

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