Eye Diagram (IMAGE)

National Institute of Standards and Technology (NIST)

Eye Diagram

Caption

These 'eye' diagrams reveal how much noise is present in a digital signal. As the signal grows noisier, its characteristic shape grows distorted, shrinking the center so it resembles an eye closing. NIST's new 3-D chip-testing method passes microwaves through chip material, allowing researchers to quickly detect flaws that would create noise and make the diagram change from the open-eyed clarity of the top image to the squintier distortion on the bottom.

Credit

Y. Obeng and N. Hanacek/NIST

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